Title :
Proton-sensitive custom SRAM detector
Author :
Soli, G.A. ; Blaes, B.R. ; Buehler, M.G.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
10/1/1992 12:00:00 AM
Abstract :
A custom 4k-bit static RAM (SRAM) chip was tested with protons. The SRAM was developed to determine the single event upset hardness of hardness of CMOS latches using alpha particle measurements and can also function as a proton detector. The authors describe a calibration procedure for the SRAM detector, allowing spectrometers to be designed for measuring proton, helium, and heavier ion environments inside spacecraft computers. The detector was calibrated for protons using the Caltech Tandem Van de Graaff. The SPICE circuit simulation program was used to compute an effective calibration curve and this curve was then used, with the proton data, to compute an effective charge collection depth, allowing calibration
Keywords :
CMOS integrated circuits; SPICE; SRAM chips; aerospace instrumentation; alpha-particle detection and measurement; calibration; proton detection and measurement; radiation hardening (electronics); semiconductor counters; CMOS latches; SPICE circuit simulation program; alpha particle measurements; calibration procedure; charge collection depth; custom SRAM detector; single event upset hardness; spectrometers; static RAM; Alpha particles; Calibration; Detectors; Latches; Protons; Random access memory; Read-write memory; Semiconductor device measurement; Single event upset; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on