DocumentCode :
808966
Title :
A fast reduced-order model for the full-wave FEM analysis of lossy inhomogeneous anisotropic waveguides
Author :
Bertazzi, Francesco ; Peverini, Oscar Antonio ; Goano, Michele ; Ghione, Giovanni ; Orta, Renato ; Tascone, Riccardo
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Volume :
50
Issue :
9
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
2108
Lastpage :
2114
Abstract :
The evaluation of the frequency response of waveguiding structures by means of the full-wave finite-element method requires solving a large generalized eigenvalue problem for each frequency. This paper describes a novel approach, based on the singular-value decomposition, which drastically reduces the order of the eigenvalue problem. By inspection of the singular values, the accuracy level of the procedure may be controlled. The technique is applied to the analysis of open and closed waveguides with arbitrary cross section, lossy conductors, and anisotropic dielectric layers, by means of vector elements of generic order; higher order elements are shown to allow the accurate evaluation of fields inside lossy conductors with fewer unknowns, besides exactly modeling normal field discontinuities at material interfaces. Examples of application of the reduced-order technique are shown concerning both non-TEM and quasi-TEM structures
Keywords :
coplanar waveguides; dielectric-loaded waveguides; eigenvalues and eigenfunctions; finite element analysis; frequency response; singular value decomposition; waveguide theory; CPW; SVD; anisotropic dielectric layers; closed waveguides; eigenvalue problem; fast reduced-order model; finite-element method; frequency response; full-wave FEM analysis; higher order elements; lossy conductors; lossy inhomogeneous anisotropic waveguides; material interfaces; nonTEM structures; normal field discontinuities; open waveguides; quasi-TEM structures; singular-value decomposition; vector elements; Anisotropic magnetoresistance; Conducting materials; Dielectric losses; Dielectric materials; Eigenvalues and eigenfunctions; Finite element methods; Frequency response; Inspection; Reduced order systems; Waveguide discontinuities;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2002.802323
Filename :
1028951
Link To Document :
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