DocumentCode :
809180
Title :
Uncertainty specification for data acquisition (DAQ) devices
Author :
Braudaway, David W.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
55
Issue :
1
fYear :
2006
Firstpage :
74
Lastpage :
78
Abstract :
Specification of uncertainty has historically been done by a variety of methods with differences in results, especially for instruments and standards that achieve small uncertainty values. A relatively simple but practical approach is used in newly published standard IEC 62008 1st Edition, "Performance characteristics and calibration methods for digital data acquisition systems and relevant software." The standard currently covers only relevant manufacturer\´s specifications for direct current (dc) data acquisition (DAQ) devices. These are plug-in cards without the associated computer for readout and control or power supply. Rather than complete instruments, the cards require an associated computer for readout and control. The history of uncertainty is reviewed; some popular current techniques for specifying uncertainty are compared. The components of uncertainty chosen for DAQ plug-in cards are reviewed, and their effects are discussed.
Keywords :
IEC standards; calibration; data acquisition; measurement standards; measurement uncertainty; calibration methods; digital data acquisition systems; direct current data acquisition devices; standard IEC 62008; uncertainty specification; Calibration; Data acquisition; IEC standards; Instruments; Manufacturing; Software performance; Software standards; Software systems; Standards publication; Uncertainty; Calibration; coverage factor; expanded uncertainty DAQ; statistics; uncertainty;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2005.862014
Filename :
1583865
Link To Document :
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