DocumentCode :
809288
Title :
Coefficient-based test of parametric faults in analog circuits
Author :
Guo, Zhen ; Savir, Jacob
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Volume :
55
Issue :
1
fYear :
2006
Firstpage :
150
Lastpage :
157
Abstract :
Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte Carlo simulation and system-identification tools to determine whether a given circuit under test (CUT) is faulty. From the circuit description, and component tolerance specifications, the tolerance boxes of all circuit transfer-function coefficients are precomputed and used during the test. Using input/output signal information, the test procedure attempts to extract the CUT´s transfer function. When this extraction is complete-if one or more of these measured transfer-function coefficients are found to be outside their tolerance boxes-the circuit is declared faulty.
Keywords :
Monte Carlo methods; analogue circuits; circuit reliability; circuit testing; fault diagnosis; fault tolerance; transfer functions; analog circuit testing; circuit transfer-function coefficients; circuit under test; coefficient-based test; component tolerance specification; deparametric faults; fault detection; input-output signal information; parameter tolerance; parametric faults; pseudo Monte Carlo simulation; system identification tools; transfer-function coefficient; Analog circuits; Circuit faults; Circuit testing; Data mining; Electrical fault detection; Fault detection; Hypercubes; Jacobian matrices; System testing; Transfer functions; Fault detection; Monte Carlo simulation; parameter tolerance; parametric faults; system identification;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2005.861490
Filename :
1583875
Link To Document :
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