Title :
TOM-based blind identification of nonlinear Volterra systems
Author :
Tan, Hong-Zhou ; Aboulnasr, Tyseer
Author_Institution :
Sch. of Inf. Technol. & Eng., Univ. of Ottawa, Ont., Canada
Abstract :
This paper extends blind single-input single-output (SISO) Volterra-system identification from the second-order statistics (SOSs) domain into the third-order statistics domain. For the full-sized Volterra system with finite order and memory, which is excited by unobservable independent identically distributed (i.i.d.) stationary random sequences, it is known that blind identifiability is not possible in the SOS domain. Although this conclusion is also true in the higher order statistics (HOSs) domain, it will be shown that under some sufficient conditions, a larger set of sparse Volterra systems can be identified blindly in third-order moment (TOM) domain than in the SOS counterpart. This is due to the fact that (n+1)(3n+2)/2 terms of different statistical quantities can be used in the third-order-statistics domain while only (n+2) terms of statistical information are nonredundant for SOS-based blind identification, where n is the memory length of the system. The validity and usefulness of the approach are demonstrated in numerical simulations as well as experiments applied to blindly identify the primary path of active-noise-control (ANC) systems in a practical scenario.
Keywords :
Volterra series; identification; method of moments; signal processing; statistical analysis; SOS-based blind identification; Volterra-system identification; active-noise-control systems; blind identifiability; finite order; higher order statistics domain; memory length; nonlinear Volterra systems; nonlinear modeling; nonlinear systems; numerical simulations; second-order statistics domain; single-input single-output; stationary random sequences; statistical information; third-order moments; third-order statistics domain; tom-based blind identification; Higher order statistics; Information technology; Integral equations; Kernel; Nonlinear equations; Numerical simulation; Random sequences; Signal processing; Statistical distributions; Sufficient conditions; Blind identification; Volterra systems; nonlinear modeling; nonlinear systems; third-order moments (TOMs);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.861496