Title :
Single-photon avalanche diode arrays for fast transients and adaptive optics
Author :
Zappa, Franco ; Tisa, Simone ; Cova, Sergio ; Maccagnani, Piera ; Calia, Domenico Bonaccini ; Saletti, Roberto ; Roncella, Roberto ; Bonanno, Giovanni ; Belluso, Massimiliano
Author_Institution :
Dipt. di Elettronica, Politecnico di Milano, Italy
Abstract :
An instrumentation based on a silicon monolithic array of 60 photon counters [single-photon avalanche diode array (SPADA)] for state-of-the-art measurements of fast transient phenomena and adaptive optics (AO) is presented. The fabricated solid-state photon counters are rugged, easy to be integrated in the optical system, free from read-out noise, and provide very fast frame rates (> 10 kHz) and nanosecond electronic gating. The detection electronics includes an integrated active-quenching circuit (AQC) for each pixel of the array. The real-time data-processing board is implemented into a field programmable gate array (FPGA) and a digital signal processor (DSP) and is configurable for dealing with different applications: acquisition and processing of two-dimensional (2-D) images with fast frame rate and extraction of the curvature wavefront for adaptive optics applications. The optical and electrical characterization of the detectors and the associated electronics is reported.
Keywords :
adaptive optics; avalanche photodiodes; image sensors; particle detectors; photodetectors; photon counting; wavefront sensors; 2D images; active-quenching circuit; adaptive optics; array detector; detection electronics; digital signal processor; electrical characterization; fast transient phenomena; field programmable gate array; image acquisition; image processing; nanosecond electronic gating; optical characterization; photon timing; single-photon avalanche diode; solid-state photon counters; state-of-the-art measurements; Adaptive arrays; Adaptive optics; Counting circuits; Diodes; Field programmable gate arrays; Instruments; Optical arrays; Optical noise; Silicon; Solid state circuits; Adaptive optics; Geiger; array detector; fast transient phenomena; photon counting; photon timing; single-photon avalanche diode (SPAD);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.861503