• DocumentCode
    809701
  • Title

    Comparison of SOI and junction isolation for substrate crosstalk suppression in mixed mode integrated circuits

  • Author

    Joardar, K.

  • Author_Institution
    Semicond. Products Sector, Motorola Inc., Mesa, AZ, USA
  • Volume
    31
  • Issue
    15
  • fYear
    1995
  • fDate
    7/20/1995 12:00:00 AM
  • Firstpage
    1230
  • Lastpage
    1231
  • Abstract
    Using two-dimensional computer simulations and measurements on silicon, it is shown that whereas silicon-on-insulator (SOI) based processes provide high isolation from crosstalk in mixed mode analogue-digital integrated circuits, p-i-n junction isolation can provide equal or better crosstalk immunity with less expense
  • Keywords
    crosstalk; digital simulation; integrated circuit modelling; isolation technology; mixed analogue-digital integrated circuits; p-n junctions; silicon-on-insulator; SOI; crosstalk immunity; junction isolation; mixed analogue-digital integrated circuits; mixed mode integrated circuits; p-i-n junction isolation; substrate crosstalk suppression; two-dimensional computer simulations;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19950861
  • Filename
    400332