Title :
FMR and EXAFS modeling of heat-treated Fe-rich and Co-rich TM-M thin films
Author :
Harris, Vincent G. ; Elam, William T. ; Vittoria, Carmine
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
fDate :
7/1/1991 12:00:00 AM
Abstract :
Ion-beam sputter-deposited alloy films of Co74Fe6B15Si5 and Fe75Ni5B15Si5 were examined for their magnetic and structural properties. Films were characterized by ferromagnetic resonance, vibrating sample magnetometry, and extended X-ray absorption fine structure (EXAFS) analysis. Using atomic parameters deduced from EXAFS modeling and fitting procedures, magnetic properties were calculated with no adjustable parameters. Correlation between perpendicular FMR measurements and EXAFS first-shell modeling suggests a low-temperature formation of cobalt-borides in the Co74Fe6B15Si5 alloy. Annealed Fe75Ni5B15Si5 samples did not display evidence of structural and/or magnetic instabilities until the onset of long-range crystallization near Tann=400 degrees C.
Keywords :
EXAFS; boron alloys; cobalt alloys; ferromagnetic properties of substances; ferromagnetic resonance; iron alloys; magnetic annealing; magnetic properties of amorphous substances; nickel alloys; silicon alloys; sputtered coatings; 300 C; 400 C; Co74Fe6B15Si5; EXAFS analysis; EXAFS first-shell modeling; Fe75Ni5B15Si5; annealing; atomic parameters; crystallites growth; extended X-ray absorption fine structure; ferromagnetic resonance; fitting procedures; heat treatment; ion beam sputter deposited alloy films; long-range crystallization; magnetic instabilities; perpendicular FMR measurements; structural instability; transition metal; vibrating sample magnetometry; Cobalt alloys; Iron alloys; Magnetic films; Magnetic properties; Magnetic resonance; Nickel alloys; Semiconductor films; Silicon alloys; Sputtering; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on