Title :
Optical reflectometry with micrometer resolution for the investigation of integrated optical devices
Author :
Beaud, Paul ; Schütz, Jürg ; Hodel, Walter ; Weber, Heinz P. ; Gilgen, Heinz H. ; Salathé, René P.
Author_Institution :
Inst. of Appl. Phys., Berne Univ., Switzerland
fDate :
4/1/1989 12:00:00 AM
Abstract :
An optical time-domain reflectometry (OTDR) system using an infrared subpicosecond pulse source in conjunction with balanced heterodyne detection is discussed. Experimental results show a density of more than 100 dB and a resolution of 60 μm in air. Taking advantage of the large tuning range of the laser system, it is possible to improve the resolution to less than 10 μm. The applicability of the OTDR system for the diagnostics of integrated optical devices is demonstrated for a simple GaAs waveguide structure
Keywords :
III-V semiconductors; gallium arsenide; integrated optics; optical testing; optical waveguides; time-domain reflectometry; GaAs; OTDR; balanced heterodyne detection; infrared subpicosecond pulse source; integrated optical devices; large tuning range; laser system; micrometer resolution; optical time-domain reflectometry system; resolution; semiconductor; waveguide structure; Infrared detectors; Laser tuning; Optical devices; Optical mixing; Optical pulses; Optical tuning; Optical waveguides; Reflectometry; Time domain analysis; Waveguide lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
