DocumentCode
810233
Title
Characteristics of laser diodes with a partially intermixed GaAs-AlGaAs quantum well
Author
Nagai, Y. ; Shigihara, K. ; Karakida, S. ; Kakimoto, S. ; Otsubo, M. ; Ikeda, K.
Author_Institution
Mitsubishi Electr. Corp., Itami, Japan
Volume
31
Issue
8
fYear
1995
fDate
8/1/1995 12:00:00 AM
Firstpage
1364
Lastpage
1370
Abstract
Laser diodes (LD´s) with a partially intermixed quantum-well (QW) active layer are fabricated by Zn out-diffusion from a p-cladding layer to the QW region. The dependencies of the degree of intermixing, measured by the photoluminescence (PL) shift, on Zn concentration of the p-cladding layer (Pclad) and the Al content of the guiding layer (Xg) in a separate-confinement-heterostructure (SCH) are investigated. Pclad changes in the range from 1×10 18 cm-3 to 4×1018 cm-3 and Xg changes in the range from 0.21-0.37. When Pclad is 2×1018 cm-3 and Xg is 0.37, large bandgap energy shift of 96.1 meV is observed. The lasing wavelengths of the LD´s, with the partially intermixed QW, are blue-shifted linearly with increasing Pclad and Xg. For the bandgap energy shift of 66.8 meV by PL, the threshold current density is increased by 33% from that of the nonintermixed LD. Reliability of LD´s with the partially intermixed QW is investigated for the first time. In spite of a large degree of intermixing the reliability of the LD with the partially intermixed QW of 66.8 meV energy shift by PL is the same as the nonintermixed one, which is confirmed by the aging test of 2500 hours at 45°C with the output power of 1 W under CW operation
Keywords
III-V semiconductors; ageing; aluminium compounds; claddings; current density; energy gap; gallium arsenide; life testing; photoluminescence; power system reliability; quantum well lasers; semiconductor device testing; spectral line shift; 1 W; 2500 h; 45 C; 66.8 meV; Al content; CW operation; GaAs-AlGaAs; GaAs-AlGaAs quantum well; Zn; Zn concentration; Zn out-diffusion; active layer; bandgap energy shift; blue-shifted; guiding layer; large bandgap energy shift; laser diodes; lasing wavelengths; output power; p-cladding layer; partially intermixed; photoluminescence shift; reliability; separate-confinement-heterostructure; threshold current density; Annealing; Diode lasers; Impurities; Optical device fabrication; Optical refraction; Optical variables control; Optical waveguide components; Optical waveguides; Photonic band gap; Zinc;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.400386
Filename
400386
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