Title :
A 36-channel parallel optical interconnect module based on optoelectronics-on-VLSI technology
Author :
Cook, Christopher ; Cunningham, John E. ; Hargrove, A. ; Ger, G.G. ; Goossen, Keith W. ; Jan, William Y. ; Kim, Helen H. ; Krause, R. ; Manges, M. ; Morrissey, M. ; Perinpanayagam, M. ; Persaud, A. ; Shevchuk, George J. ; Sinyansky, Victor ; Krishnamoorth
Author_Institution :
AraLight Inc., NJ, USA
Abstract :
We describe the packaging and testing of a two-dimensional array parallel-optics module with 36 channels with each channel operating up to 3.3 Gb/s. This represents the first commercial module based on direct integration of vertical-cavity surface-emitting lasers (VCSELs) onto silicon very large scale integration (VLSI) circuits using a hybrid optoelectronic-VLSI technology. The module eliminates wire bonds between the driver/receiver chips and the corresponding VCSELs thereby reducing crosstalk and power dissipation, simplifying packaging and alignment, and simultaneously improving bandwidth and total link jitter performance.
Keywords :
BiCMOS integrated circuits; VLSI; integrated circuit packaging; integrated circuit testing; integrated optoelectronics; jitter; modules; optical crosstalk; optical interconnections; optical receivers; optical transmitters; printed circuit design; semiconductor laser arrays; surface emitting lasers; 3.3 Gbit/s; 36-channel parallel optical interconnect module; SiGe BiCMOS technology; VCSELs; VLSI circuits; bandwidth performance; crosstalk; direct integration; hybrid optoelectronic-VLSI technology; multimode fiber; optoelectronics-on-VLSI technology; packaging; power dissipation; printed circuit board design; receiver eye diagram; testing; total link jitter performance; transmitter module; two-dimensional array parallel-optics module; vertical-cavity surface-emitting lasers; Circuit testing; Crosstalk; Driver circuits; Optical interconnections; Packaging; Silicon; Surface emitting lasers; Vertical cavity surface emitting lasers; Very large scale integration; Wire;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2003.813306
