• DocumentCode
    810988
  • Title

    Diagnostic-strategy selection for series systems

  • Author

    Nachlas, Joel A. ; Loney, Susan R. ; Binney, Blair A.

  • Author_Institution
    Dept. of Ind. Eng. & Oper. Res., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    39
  • Issue
    3
  • fYear
    1990
  • fDate
    8/1/1990 12:00:00 AM
  • Firstpage
    273
  • Lastpage
    280
  • Abstract
    The selection of efficient testing strategies for repairable systems composed of components arranged in series is considered. Two cost models (for perfect and imperfect testing) represent the consequences of possible test realizations. The probability that any particular component is responsible for the failure is derived and used as a basis for the two models. The model for perfect testing is solved exactly. In the optimal perfect-test sequence the components are tested in decreasing order of the ratio of: [probability that the component is responsible for the system failure] to [component test cost]. For imperfect testing, possible diagnostic errors are included in a model for which two heuristic solution strategies are provided. The model represents the consequences of both false-positive and false-negative component-test outcomes. The heuristic strategies yield efficient test sequences. Under reasonable assumptions, the second heuristic strategy is guaranteed to locate the optimal test sequence. The model can quantitatively evaluate the benefits of test-accuracy enhancement plans. These models and algorithms provide convenient methods for selecting efficient test-sequences. This is illustrated by representative examples
  • Keywords
    electronic equipment testing; failure analysis; probability; reliability theory; cost models; diagnostic errors; diagnostic strategy selection; electronic systems; failure; false-negative component-test; false-positive component-test; heuristic solution strategies; imperfect testing; optimal test sequence; perfect testing; probability; reliability; repairable systems; series systems; testing strategies; Circuit testing; Cost function; Electronic components; Electronic equipment testing; Failure analysis; Manufacturing; Printed circuits; Sequential analysis; System testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.103000
  • Filename
    103000