Title :
Strongly Diagnosable Systems under the Comparison Diagnosis Model
Author :
Hsieh, Sun-Yuan ; Chen, Yu-Shu
Author_Institution :
Dept. of´´Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan
Abstract :
A system is t-diagnosable if all faulty nodes can be identified without replacement when the number of faults does not exceed t, where t is some positive integer. Furthermore, a system is strongly t-diagnosable if it is t-diagnosable and can achieve (t+1)-diagnosable except for the case where a node´s neighbors are all faulty. In this paper, we propose some conditions for verifying whether a class of interconnection networks, called matching composition networks (MCNs), are strongly diagnosable under the comparison diagnosis model.
Keywords :
fault diagnosis; graph theory; multiprocessor interconnection networks; fault diagnosis; graph theory; interconnection network; matching composition network; strongly t-diagnosable system; t-diagnosable system; Computer Society; Fault detection; Fault diagnosis; Graph theory; Maintenance; Multiprocessing systems; Multiprocessor interconnection networks; Sufficient conditions; System testing; Very large scale integration; Diagnostics; Graph Theory; Network problems; Topology;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.2008.104