DocumentCode :
811033
Title :
Fast fault-tree evaluation for many sets of input data
Author :
Schneeweiss, Winfrid G.
Author_Institution :
Fernuniv., Hagen, West Germany
Volume :
39
Issue :
3
fYear :
1990
fDate :
8/1/1990 12:00:00 AM
Firstpage :
296
Lastpage :
300
Abstract :
It is pointed out that system unavailability and failure frequency can be found for many sets of components data via symbolic formulas with few multiplications. The derivation of such symbolic formulas is possible by binary-tree algorithms (specifically the Shannon expansion) which could run very fast on supercomputers allowing for binary-tree parallelism. The reduction factor of the number of multiplications needed in nested versus polynomial forms is roughly half the height of the decomposition tree, and the height of the tree is roughly the number of system components
Keywords :
Boolean algebra; failure analysis; reliability theory; trees (mathematics); Boolean algebra; Shannon expansion; binary-tree algorithms; failure frequency; fast fault tree evaluation; multiplications; reliability; symbolic formulas; system unavailability; Boolean algebra; Boolean functions; Concurrent computing; Failure analysis; Fault trees; Frequency; Logic functions; Parallel processing; Polynomials; Supercomputers;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.103006
Filename :
103006
Link To Document :
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