Title :
Three-dimensional MEMS photonic cross-connect switch design and performance
Author :
Zheng, Xuezhe ; Kaman, Volkan ; Yuan, Shifu ; Xu, Yuanjian ; Jerphagnon, Olivier ; Keating, Adrian ; Anderson, Robert C. ; Poulsen, Henrik N. ; Liu, Bin ; Sechrist, James R. ; Pusarla, Chandrasekhar ; Helkey, Roger ; Blumenthal, Daniel J. ; Bowers, John E
Author_Institution :
Calient Networks, Goleta, CA, USA
Abstract :
Photonic cross-connects (PXC) play a key role in all-optical transparent networks. In this paper, the optical design and modeling of a three-dimensional microelectromechanical system (3-D MEMS) based optical switch are discussed. Basic design rules and considerations are reviewed and used to determine the optimum configuration for free-space optical switches with more than 300 ports. The optical performance of a 256 × 256 PXC system, including a 347 × 347 nonblocking core switch and auxiliary 2 × 2 optical switches for 1:1 protection and optical taps for power monitoring, is presented. The core switch has 1.4-dB median insertion loss, 1.5-dB wavelength dependent loss across a broadband of 1260-1625 nm, and a typical polarization dependent loss of 0.1 dB. Environmental tests including temperature and vibration are described.
Keywords :
dynamic testing; environmental testing; micro-optics; microswitches; optical fibre networks; optical losses; optical switches; photonic switching systems; 0.1 dB; 1.4 dB; 1.5 dB; 1260 to 1625 nm; 3-D MEMS based optical switch; all-optical transparent networks; auxiliary optical switches; design rules; environmental tests; free-space optical switches; median insertion loss; modeling; nonblocking core switch; optical design; optical performance; optical taps; polarization dependent loss; power monitoring; three-dimensional MEMS photonic cross-connect switch design; three-dimensional microelectromechanical system; wavelength dependent loss; Insertion loss; Microelectromechanical systems; Micromechanical devices; Monitoring; Optical design; Optical losses; Optical polarization; Optical switches; Power system protection; Testing;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2003.813321