DocumentCode :
811058
Title :
Transient analysis of multiple tuned injection-locked amplifiers with modulated input signal
Author :
Calandra, Enrico F. ; Sommariva, Antonino M.
Author_Institution :
Dept. of Electr. Eng., Palermo Univ., Italy
Volume :
37
Issue :
5
fYear :
1989
fDate :
5/1/1989 12:00:00 AM
Firstpage :
826
Lastpage :
835
Abstract :
A method is presented for the dynamical investigation of reflection-type injection-locked amplifiers (ILAs) driven by modulated input signals. Its distinctive feature is to cover the large-signal analysis of high-order ILAs, allowing the use of broad-banding multiresonant structures. Small-parameter, stroboscopic, and congruence algebra techniques are combined to permit the calculation of output voltage transients directly in terms of amplitude and phase of the complex envelope, thus limiting the computational time required in CAD (computer-aided design) applications. Further, owing to the used black-box (scattering matrix) descriptions of the tank and coupling two-port, both linear and nonlinear subsystem identification can be performed in terms of measured data. As an example of the application of the method, a fourth-order ILA is analyzed, and results pertaining to binary phase-shift keyed (BPSK) modulated input signals are presented.<>
Keywords :
S-matrix theory; equivalent circuits; microwave amplifiers; network analysis; solid-state microwave circuits; transient response; BPSK; CAD; binary phase-shift keyed; broad-banding multiresonant structures; complex envelope amplitude; complex envelope phase; computer-aided design; congruence algebra techniques; coupling two-port; injection-locked amplifiers; large-signal analysis; linear subsystem identification; microwave amplifiers; modulated input signal; multiple tuned amplifiers; nonlinear subsystem identification; output voltage transients; reflection-type; scattering matrix; small parameter technique; stroboscopic technique; tank; transient analysis; Algebra; Application software; Binary phase shift keying; Couplings; Design automation; Performance evaluation; Scattering; Signal analysis; Transient analysis; Voltage;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.17448
Filename :
17448
Link To Document :
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