DocumentCode :
811101
Title :
Performance Improvement of Organic Thin-Film Transistors by Electrode/Pentacene Interface Treatment Using a Hydrogen Plasma
Author :
Lee, Joo-Won ; Chang, Jea-Won ; Kim, Dong-Joo ; Yoon, Young-Soo ; Kim, Jai-Kyeong
Author_Institution :
Dept. of Adv. Tech, Kon-Kuk Univ., Seoul
Volume :
28
Issue :
5
fYear :
2007
fDate :
5/1/2007 12:00:00 AM
Firstpage :
379
Lastpage :
382
Abstract :
Pentacene-based organic thin-film transistors (TFTs) have been fabricated with and without treatment by hydrogen (H2) plasma at the interface between the electrode and the pentacene surface. Processing with a H2 plasma was carried out in a plasma-enhanced chemical vapor deposition with varying treatment times. The interface treatment by H2 plasma resulted in improved device electrical properties. Removal of oxygen from the pentacene surface occurs due to slight etching by the plasma. Sufficient flux density of the H2 plasma leads to full pentacene-surface coverage by rearranging the hydrogen with carbon instead of oxygen. Atomic force microscopy profiles reveal the morphology changes of the pentacene surface after treatment, and secondary ion mass spectrometry shows the change via compositional depth profiles indicating H2 , O2, and C-H binding. Hydrogen treatment, therefore, appears to modify the interface by removing the surface oxygen layer, resulting in better performance of the organic TFT
Keywords :
atomic force microscopy; organic compounds; sputter etching; thin film transistors; SIMS; TFT; atomic force microscopy; electrode/pentacene interface treatment; hydrogen plasma; hydrogen treatment; organic thin-film transistors; pentacene surface; plasma etching; secondary ion mass spectrometry; surface treatment; Electrodes; Hydrogen; Organic thin film transistors; Pentacene; Plasma applications; Plasma chemistry; Plasma devices; Plasma materials processing; Plasma properties; Thin film transistors; H$_{2}$ plasma; interface; mobility; organic thin film transistor (OTFT); secondary ion mass spectrometry (SIMS); surface treatment;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2007.895382
Filename :
4160028
Link To Document :
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