Title :
Bayes comparison of two lognormal reliability functions
Author :
Selby, M.A. ; Shoukri, M.M.
Author_Institution :
Dept. of Math. & Stat., Windsor Univ., Ont., Canada
fDate :
8/1/1990 12:00:00 AM
Abstract :
A Bayes approach is used to test the equality of two reliability functions when the underlying distributions of the times-to-failure are lognormal. Using the method of moments it is found that a normal approximation of the posterior distribution of the threshold parameter is better than an approximation based on the Student t-distribution. Analytic foundations of the conclusions are provided
Keywords :
Bayes methods; failure analysis; reliability theory; statistical analysis; Bayes approach; Student t-distribution; lognormal reliability functions; method of moments; normal approximation; threshold parameter; times-to-failure; Manufacturing processes; Statistical analysis; Statistical distributions; Testing;
Journal_Title :
Reliability, IEEE Transactions on
