DocumentCode
811197
Title
Bayes comparison of two lognormal reliability functions
Author
Selby, M.A. ; Shoukri, M.M.
Author_Institution
Dept. of Math. & Stat., Windsor Univ., Ont., Canada
Volume
39
Issue
3
fYear
1990
fDate
8/1/1990 12:00:00 AM
Firstpage
336
Lastpage
341
Abstract
A Bayes approach is used to test the equality of two reliability functions when the underlying distributions of the times-to-failure are lognormal. Using the method of moments it is found that a normal approximation of the posterior distribution of the threshold parameter is better than an approximation based on the Student t-distribution. Analytic foundations of the conclusions are provided
Keywords
Bayes methods; failure analysis; reliability theory; statistical analysis; Bayes approach; Student t-distribution; lognormal reliability functions; method of moments; normal approximation; threshold parameter; times-to-failure; Manufacturing processes; Statistical analysis; Statistical distributions; Testing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.103014
Filename
103014
Link To Document