DocumentCode
811246
Title
High brightness InGaN green LEDs with an ITO on n++-SPS upper contact
Author
Chang, C.S. ; Chang, S.J. ; Su, Y.K. ; Kuo, C.H. ; Lai, W.C. ; Lin, Y.C. ; Hsu, Y.P. ; Shei, S.C. ; Tsai, J.M. ; Lo, H.M. ; Ke, J.C. ; Sheu, J.K.
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Taiwan, Taiwan
Volume
50
Issue
11
fYear
2003
Firstpage
2208
Lastpage
2212
Abstract
Indium tin oxide (ITO) (260 nm) and Ni (5 nm)/Au (10 nm) films were deposited onto glass substrates, p-GaN layers, n+-InGaN/GaN short-period-superlattice (SPS), n++-SPS and nitride-based green light-emitting diodes (LEDs). It was found that ITO could provide us an extremely high transparency (i.e., 95% at 520 nm). It was also found that the 1.03×10-3 Ωcm2 specific contact resistance of ITO on n++-SPS was reasonably small. Although the forward voltage of the LED with ITO on n++-SPS upper contacts was slightly higher than that of the LED with Ni/Au on n++-SPS upper contacts, the 20 mA output power and external quantum efficiency of the former could reach 4.98 mW and 8.2%, respectively, which were much larger than the values observed from the latter. The reliability of ITO on n++-SPS upper contacts was also found to be reasonably good.
Keywords
III-V semiconductors; contact resistance; gallium compounds; indium compounds; light emitting diodes; ohmic contacts; semiconductor device reliability; semiconductor superlattices; tin compounds; transparency; wide band gap semiconductors; 10 nm; 20 mA; 260 nm; 4.98 mW; 5 nm; 520 nm; 8.2 percent; ITO; ITO on n++-SPS upper contact; InGaN-GaN; InSnO; Ni-Au; Ni/Au films; external quantum efficiency; extremely high transparency; forward voltage; glass substrates; high brightness InGaN green LEDs; n+-InGaN/GaN short-period-superlattice; output power; p-GaN layers; reliability; specific contact resistance; Brightness; Contact resistance; Gallium nitride; Gold; Indium tin oxide; Ionization; Light emitting diodes; Superlattices; Tunneling; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2003.819091
Filename
1239037
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