DocumentCode :
811376
Title :
1000-V 9.1- \\hbox {m}\\Omega \\cdot \\hbox {cm}^{2} Normally Off 4H-SiC Lateral RESURF JFET for Power Integrated Circuit Applications
Author :
Zhang, Yongxi ; Sheng, Kuang ; Su, Ming ; Zhao, Jian H. ; Alexandrov, Petre ; Fursin, Leonid
Author_Institution :
Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ
Volume :
28
Issue :
5
fYear :
2007
fDate :
5/1/2007 12:00:00 AM
Firstpage :
404
Lastpage :
407
Abstract :
A 4H-SiC normally off vertical channel lateral reduced-surface electric-field (RESURF) junction field-effect transistor (JFET) with a blocking voltage Vbr of 1028 V and a specific on-resistance R on-sp of 9.1 mOmegamiddotcm2 has been experimentally demonstrated. The device has a Vbr 2/Ron-sp figure-of-merit of 116 MW/cm2, which is the highest value achieved to date on a 4H-SiC lateral power transistor. Also reported is a larger JFET that is capable of handling over 0.5-A current on an active area of 4.01times10-3 cm2. The fabricated double-RESURF devices have a vertical channel length of 1.8 mum, created by tilted aluminum (Al) implantation on the sidewalls of deep trenches, and a lateral drift-region length of 7.5 mum. In addition, low-voltage logic-inverter circuits based on the same lateral JFET process have been monolithically integrated on the same chip. Proper logic-inverter function has also been demonstrated
Keywords :
junction gate field effect transistors; logic gates; low-power electronics; power integrated circuits; silicon compounds; wide band gap semiconductors; 1000 V; 1028 V; SiC; junction field-effect transistor; lateral RESURF JFET; lateral power transistor; low-voltage logic-inverter circuits; power integrated circuit; reduced-surface electric-field; tilted aluminum implantation; FETs; JFET integrated circuits; MOSFETs; Photonic band gap; Power integrated circuits; Power transistors; Robustness; Silicon carbide; Temperature; Thermal management; Junction field-effect transistor (JFET); normally off; power integrated circuits; reduced-surface electric-field (RESURF) effect; silicon carbide (SiC);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2007.895448
Filename :
4160055
Link To Document :
بازگشت