Title :
A Compact, ESD-Protected, SiGe BiCMOS LNA for Ultra-Wideband Applications
Author :
Bhatia, Karan ; Hyvonen, Sami ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL
fDate :
5/1/2007 12:00:00 AM
Abstract :
Two 3.65-mW, ESD-protected, BiCMOS ultra-wideband low-noise amplifiers (LNAs) for operation up to 10 GHz are presented. These common-base LNAs achieve significant savings in die area over more widely used cascoded common-emitter LNAs because they do not use an LC input matching network. A design with a shunt peaked load achieves a high S21 (17-19 dB) and low noise figure (NF) (4-5 dB) across the band. A resistively loaded design exhibits a lower S21 (15-16 dB) and higher NF (4.5-6 dB), but also utilizes 20% less silicon area. Both LNAs achieve a 1.5 kV ESD protection level and an acceptable S11 (<-10 dB) across the band. Current source noise reduction is critical in common base topologies. Therefore, detailed noise analyses of MOS- and HBT-based current sources are provided
Keywords :
BiCMOS analogue integrated circuits; Ge-Si alloys; constant current sources; electrostatic discharge; low noise amplifiers; microwave amplifiers; ultra wideband technology; 1.5 kV; 3.65 mW; 4 to 6 dB; BiCMOS ultra-wideband low-noise amplifiers; ESD protection; HBT-based current sources; MOS-based current sources; SiGe; SiGe BiCMOS LNA; cascoded common-emitter LNA; current source noise reduction; noise analyses; ultra-wideband applications; BiCMOS integrated circuits; Electrostatic discharge; Germanium silicon alloys; Impedance matching; Low-noise amplifiers; Noise figure; Noise measurement; Protection; Silicon germanium; Ultra wideband technology; BiCMOS analog integrated circuits; RL circuits; broadband amplifiers; circuit topology; electrostatic discharges; impedance matching; noise;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2007.894826