DocumentCode
811547
Title
Approaches to proton single-event rate calculations
Author
Petersen, Edward L.
Author_Institution
Fairfax, VA, USA
Volume
43
Issue
2
fYear
1996
fDate
4/1/1996 12:00:00 AM
Firstpage
496
Lastpage
504
Abstract
This article discusses the fundamentals of proton-induced single-event upsets and of the various methods that have been developed to calculate upset rates. Two types of approaches are used based on nuclear-reaction analysis. Several aspects can be analyzed using analytic methods, but a complete description is not available. The paper presents an analytic description for the component due to elastic-scattering recoils. There have been a number of studies made using Monte Carlo methods. These can completely describe the reaction processes, including the effect of nuclear reactions occurring outside the device-sensitive volume. They have not included the elastic-scattering processes. The article describes the semiempirical approaches that are most widely used. The quality of previous upset predictions relative to space observations is discussed and leads to comments about the desired quality of future predictions. Brief sections treat the possible testing limitation due to total ionizing dose effects, the relationship of proton and heavy-ion upsets, upsets due to direct proton ionization, and relative proton and cosmic-ray upset rates
Keywords
Monte Carlo methods; cosmic ray interactions; integrated circuit reliability; ion beam effects; proton effects; radiation hardening (electronics); semiconductor device reliability; space vehicle electronics; Monte Carlo methods; cosmic-ray upset rates; direct proton ionization; effect of nuclear reactions; elastic-scattering recoils; galactic cosmic rays; heavy-ion upsets; nuclear-reaction analysis; proton belts; proton single-event rate calculations; proton upsets; reaction processes; semiempirical approaches; testing limitation; total ionizing dose effects; Belts; Energy measurement; Equations; Extraterrestrial measurements; Monte Carlo methods; Orbital calculations; Particle scattering; Protons; Silicon; Volume measurement;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.490896
Filename
490896
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