• DocumentCode
    811818
  • Title

    Dependence of Phase Instabilities on Bunch Length at the CEA

  • Author

    Averill, R. ; Eddy, R. ; Hofmann, A. ; Little, R. ; Mieras, H. ; Nicholls, G. ; Paterson, J.M. ; Strauch, K. ; Voss, G.-A. ; Winick, H.

  • Author_Institution
    Cambridge Electron Accelerator Harvard University and Massachusetts Institute of Technology Cambridge, Massachusetts
  • Volume
    20
  • Issue
    3
  • fYear
    1973
  • fDate
    6/1/1973 12:00:00 AM
  • Firstpage
    765
  • Lastpage
    767
  • Abstract
    Betatron and phase instabilities have been observed at the CEA during multicycle filling and dc storage. The betatron instabilities are caused by the head-tail effect and have been controlled with sextupoles which make the chromaticity zero or slightly positive. The phase instability at present limits the electron and positron current which can be accumulated. We have made measurements of the threshold currents required to observe the onset of phase instabilities. These measurements show: a. The threshold current required to observe the onset of this phase instability is independent of the number of bunches down even to one bunch. (Here and throughout this paper, current is defined as the current in one bunch averaged over one rf period, ie., 1 mA = 1.4 × 107/bunch.) b. The threshold current for the onset of this instability first decreases with increasing bunch length, goes through a minimum, then increases again for long bunch length. A cavity operating at the third harmonic of the main accelerating system frequency, thus providing increased nonlinearity of the total rf voltage waveform (hence increasing the Landau damping), increased the threshold current for the onset of these instabilities.
  • Keywords
    Acceleration; Current measurement; Damping; Electrons; Filling; Frequency; Phase measurement; Positrons; Threshold current; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1973.4327236
  • Filename
    4327236