DocumentCode :
81213
Title :
Addendum to “Modeling MOSFET Drain Current Non-Gaussian Distribution With Power-Normal Probability Density Function” [Feb 14 154-156]
Author :
Yu, Bei ; Yuan, Yuan
Author_Institution :
Qualcomm Technologies Inc., San Diego, CA, USA
Volume :
35
Issue :
8
fYear :
2014
fDate :
Aug. 2014
Firstpage :
883
Lastpage :
883
Abstract :
In our paper “Modeling MOSFET Drain Current Non-Gaussian Distribution with Power-Normal Probability Density Function” [1] published in IEEE Electron Device Letters, Feburary 2014, the analytic results are derived for power Gaussian distribution (PGD) with integer (n) only. It appears to be a limitation in practical application, where one may need non-integer (n) for a more accurate model, e.g., (n=1.5) . This addendum is to show that our analytic results, without any format change, are also applicable to non-integer (n) . Therefore, the integer limitation can be stripped off from our model, which in fact is capable of providing continuous coverage.
Keywords :
MOSFET; Monte Carlo methods; Probability density function; SRAM chips; Silicon;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2014.2331067
Filename :
6849448
Link To Document :
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