• DocumentCode
    812152
  • Title

    Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

  • Volume
    54
  • Issue
    5
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    1274
  • Lastpage
    1274
  • Abstract
    Provides notice of upcoming special issue(s) of interest to practitioners and researchers.
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.897524
  • Filename
    4160130
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=812152