DocumentCode
8122
Title
A New Slit-Type Vacuum-Channel Transistor
Author
In Jun Park ; Seok-Gy Jeon ; Changhwan Shin
Author_Institution
Sch. of Electr. & Comput. Eng., Univ. of Seoul, Seoul, South Korea
Volume
61
Issue
12
fYear
2014
fDate
Dec. 2014
Firstpage
4186
Lastpage
4191
Abstract
A new vacuum-channel transistor with a carbon nanotube cathode and nanometer-scale channel length-called a slit-type vacuum-channel transistor is proposed and investigated. The suggested device structure features distinguishable cutoff, linear, and saturation regions with a negligible gate leakage current. Its channel length is almost the same as the mean free path of carriers in air, which suggests that the device can operate not only in vacuum but also in air, without any performance degradation. Because of its geometrical characteristics, it is possible for this device to be operated when the anode bias is almost the same as the gate bias with negligible oxide leakage. Therefore, the device can be used as an elemental device component in digital integrated circuits.
Keywords
carbon nanotubes; cathodes; transistors; vacuum microelectronics; anode bias; carbon nanotube cathode; device structure; gate bias; nanometer scale channel length; saturation regions; slit type vacuum channel transistor; Anodes; Cathodes; Leakage currents; Logic gates; Performance evaluation; Transistors; Vacuum systems; CST PARTICLE STUDIO; Carbon nanotube; vacuum transistor; vacuum transistor.;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2014.2361912
Filename
6933916
Link To Document