DocumentCode :
812230
Title :
Characteristics of InAlAs/InGaAsP quantum-well HEMTs
Author :
Hong, Woo-Pyo ; Bhat, Ritesh ; Hayes, J.R. ; Chang, G.K. ; Nguyen, Cam ; Koza, M.
Author_Institution :
Bellcore, Red Bank, NJ
Volume :
38
Issue :
12
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Firstpage :
2701
Lastpage :
2702
Abstract :
Summary form only given. An investigation of the DC and RF characteristics of InAlAs/InGaAsP quantum-well channel HEMTs is discussed. The InAlAs/InxGa1-xAsyP1-y quantum-well HEMT structures lattice matched to InP (y=2.2 (1- x)) were grown by low-pressure OMCVD. The experimental data show that InAlAs/InGaAsP quaternary quantum-well channel HEMTs have significant potential for high-speed, high-voltage gain, and high-power applications
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; gallium compounds; high electron mobility transistors; indium compounds; semiconductor quantum wells; solid-state microwave devices; vapour phase epitaxial growth; DC characteristics; HEMTs; InAlAs-InxGa1-xAsyP1-y ; RF characteristics; experimental data; high-power applications; high-speed; high-voltage gain; low-pressure OMCVD; microwave devices; quantum-well channel; semiconductors; Electric breakdown; Fabrication; HEMTs; Indium compounds; Indium gallium arsenide; Indium phosphide; MODFETs; Photonic band gap; Quantum well devices; Quantum wells;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.158720
Filename :
158720
Link To Document :
بازگشت