DocumentCode :
812243
Title :
Isolation charge pump fabricated in silicon on sapphire CMOS technology
Author :
Culurciello, E. ; Pouliquen, P.O. ; Andreou, A.G.
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
Volume :
41
Issue :
10
fYear :
2005
fDate :
5/12/2005 12:00:00 AM
Firstpage :
590
Lastpage :
592
Abstract :
The design, fabrication and testing of a four-stage charge-pump fabricated in a 0.5 μm silicon-on-sapphire CMOS technology is reported. The charge pump can generate a 2.68 V output with a 3.3 V input power supply, consuming 2.5 mA. The performance of the architecture is optimised by judiciously employing MOS transistors with different threshold (0, 0.3 and 0.7 V) in the different parts of the circuit. The charge pump input and output power supplies are galvanically isolated to over 800 V by means of the dielectric properties of the coupling capacitors and the insulating sapphire substrate.
Keywords :
CMOS integrated circuits; MOSFET; power supply circuits; sapphire; silicon-on-insulator; 0.5 micron; 2.5 mA; 2.68 V; 3.3 V; MOS transistors; coupling capacitors; dielectric properties; isolation charge pump; sapphire substrate; silicon on sapphire CMOS technology;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20050312
Filename :
1432535
Link To Document :
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