Title :
Single-event effects in analog and mixed-signal integrated circuits
Author :
Turflinger, Thomas L.
Author_Institution :
NSWC, Crane, IN, USA
fDate :
4/1/1996 12:00:00 AM
Abstract :
Analog and mixed-signal integrated circuits are also susceptible to single-event effects, but they have rarely been tested. Analog circuit single-particle transients require modified test techniques and data analysis. Existing work is reviewed and future concerns are outlined
Keywords :
analogue integrated circuits; analogue-digital conversion; data analysis; integrated circuit modelling; integrated circuit testing; mixed analogue-digital integrated circuits; radiation effects; sampled data circuits; space vehicle electronics; transients; A/D convertor; analog integrated circuits; data analysis; heavy ion effects; mixed-signal integrated circuits; modified test; operational amplifier; sampled data circuit; single-event effects; single-particle transients; space vehicle electronics; time model; Bandwidth; Control theory; Feedback circuits; Frequency response; Integrated circuit modeling; Mixed analog digital integrated circuits; Operational amplifiers; Sampled data systems; Sampling methods; Time factors;
Journal_Title :
Nuclear Science, IEEE Transactions on
