• DocumentCode
    812368
  • Title

    GaAs see the light [photodetectors]

  • Author

    Woodall, Jerry M. ; Warren, A.C. ; McInturff, D.T. ; Burroughes, J. ; Hodgson, Robert ; Melloch, M.R.

  • Author_Institution
    IBM Res. Div., Yorktown Heights, NY
  • Volume
    38
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    2707
  • Abstract
    Summary form only given. Reported are p-i-n photodetectors using GaAs with As precipitates (GaAs:As) that detect 1.3-μm light with reasonable efficiency. Since high-performance GaAs electronic circuits can be epitaxially grown on GaAs:As, this work may open the way for an all-GaAs 1.3-μm optical receiver chip. In the GaAs p-i-n devices, the i layer was a 1-μm-thick layer of GaAs:As. MSM structures with GaAs:As as the optically active material were also made
  • Keywords
    III-V semiconductors; arsenic; gallium arsenide; metal-semiconductor-metal structures; p-i-n diodes; photodetectors; photodiodes; 1.3 micron; As precipitates; GaAs:As; MSM structures; PIN diodes; optical receiver chip; optically active material; p-i-n photodetectors; Cobalt; Dark current; Frequency; Gallium arsenide; Optical films; PIN photodiodes; Photodetectors; Silicides; Surface emitting lasers; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.158732
  • Filename
    158732