DocumentCode :
812375
Title :
High-density, planar Zn-diffused InGaAs/InP photodetector arrays with extended short-wavelength response
Author :
Kellert, F. ; Hodge, L.A.
Volume :
38
Issue :
12
fYear :
1991
fDate :
12/1/1991 12:00:00 AM
Firstpage :
2707
Abstract :
Summary form only given. A 512-element InGaAs photodetector array with low leakage, usable optical response from 600 to 1700 nm, and an element separation of 4.5 μm was developed. Electrical characterization of individual photodiode elements revealed a dark current of <1.0 nA at -4.0 V and a dynamic resistance of >400 MΩ at 0 V. These values are indicative of the high electrical isolation of individual elements despite the close proximity. Optical responsivity with no antireflection coating was 0.28 A/W at 600 nm and increased approximately linearly to 0.94 A/W at 1600 nm. Optical crosstalk between adjacent photodetectors was less than 1.0% at 1300 nm
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; photodetectors; semiconductor doping; zinc; 1 nA; 400 Mohm; 600 to 1700 nm; InGaAs-InP:Zn; dark current; dynamic resistance; electrical isolation; extended short-wavelength response; high-density planar array; optical crosstalk; optical response; photodetector arrays; Coatings; Dark current; Electric resistance; Indium gallium arsenide; Indium phosphide; Linear approximation; Optical arrays; Optical crosstalk; Photodetectors; Photodiodes;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.158733
Filename :
158733
Link To Document :
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