• DocumentCode
    812375
  • Title

    High-density, planar Zn-diffused InGaAs/InP photodetector arrays with extended short-wavelength response

  • Author

    Kellert, F. ; Hodge, L.A.

  • Volume
    38
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    2707
  • Abstract
    Summary form only given. A 512-element InGaAs photodetector array with low leakage, usable optical response from 600 to 1700 nm, and an element separation of 4.5 μm was developed. Electrical characterization of individual photodiode elements revealed a dark current of <1.0 nA at -4.0 V and a dynamic resistance of >400 MΩ at 0 V. These values are indicative of the high electrical isolation of individual elements despite the close proximity. Optical responsivity with no antireflection coating was 0.28 A/W at 600 nm and increased approximately linearly to 0.94 A/W at 1600 nm. Optical crosstalk between adjacent photodetectors was less than 1.0% at 1300 nm
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; photodetectors; semiconductor doping; zinc; 1 nA; 400 Mohm; 600 to 1700 nm; InGaAs-InP:Zn; dark current; dynamic resistance; electrical isolation; extended short-wavelength response; high-density planar array; optical crosstalk; optical response; photodetector arrays; Coatings; Dark current; Electric resistance; Indium gallium arsenide; Indium phosphide; Linear approximation; Optical arrays; Optical crosstalk; Photodetectors; Photodiodes;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.158733
  • Filename
    158733