Title :
Recent trends in single-event effect ground testing
Author :
Duzellier, S. ; Ecoffet, R.
Author_Institution :
ONERA-CERT, Toulouse, France
fDate :
4/1/1996 12:00:00 AM
Abstract :
Single-event phenomena result from a single particle, heavy ion or proton, inducing transients in the sensitive volume of integrated circuits. Particle accelerators are used to simulate the space environment in order to perform a full characterization of the components. This paper describes the methods and facilities necessary for single-event effect (SEE) testing as well as recent trends observed in the device response to radiation
Keywords :
aerospace simulation; beam handling equipment; beam handling techniques; integrated circuit testing; ion beam effects; laboratory techniques; particle accelerators; proton effects; radiation hardening (electronics); simulation; space vehicle electronics; transients; cross section measurement; fibre optics; heavy ion; integrated circuits; laboratory facilities; optoelectronics; particle accelerators; proton; response to radiation; simulation; single particle; single-event effect ground testing; space environment; transients; Acceleration; Circuit simulation; Circuit testing; Energy exchange; Energy measurement; Integrated circuit testing; Ionization; Linear particle accelerator; Protons; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
