DocumentCode :
812901
Title :
Digital Background-Calibration Algorithm for “Split ADC” Architecture
Author :
McNeill, John A. ; Coln, Michael C W ; Brown, D. Richard ; Larivee, Brian J.
Author_Institution :
Electr. & Comput. Eng. Dept., Worcester Polytech. Inst., Worcester, MA
Volume :
56
Issue :
2
fYear :
2009
Firstpage :
294
Lastpage :
306
Abstract :
The ldquosplit ADCrdquo architecture enables continuous digital background calibration by splitting the die area of a single ADC design into two independent halves, each converting the same input signal. The two independent outputs are averaged to produce the ADC output code. The difference of the two outputs provides information for a background-calibration algorithm. Since both ADCs convert the same input, when correctly calibrated, their outputs should be equal, and the difference should be zero. Any nonzero difference provides information to an error-estimation algorithm, which adjusts digital-calibration parameters in an adaptive process similar to a least mean square algorithm. This paper describes the calibration algorithm implemented in the specific realization of a 16-bit 1-MS/s algorithmic cyclic ADC. In addition to correcting ADC linearity, the calibration and estimation algorithms are tolerant of offset error and remove linear scale-factor-error mismatch between the ADC channels. Simulated results are presented confirming self-calibration in approximately 10 000 conversions, which represents an improvement of four orders of magnitude over previous statistically based calibration algorithms.
Keywords :
analogue-digital conversion; calibration; least mean squares methods; digital background-calibration algorithm; error-estimation algorithm; least mean square algorithm; linear scale-factor- error mismatch; split ADC; Adaptive systems; analog–digital conversion; calibration; digital background calibration; mixed analog–digital integrated circuits; self-calibrating;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2008.2001830
Filename :
4571117
Link To Document :
بازگشت