DocumentCode
813128
Title
Radiation Induced Currents in Subminiature Coaxial Cables
Author
Bernstein, Melvin J.
Author_Institution
Materials Sciences Laboratory the Aerospace Corporation, El Segundo, California 90245
Volume
20
Issue
6
fYear
1973
Firstpage
58
Lastpage
63
Abstract
Subminiature coaxial cables smaller than RG-58 were exposed to intense pulsed irradiation from a plasma focus device, and the currents induced on the center conductors were measured in a vacuum environment. The incident photons had energies mostly below 70 keV, and filters were used to vary the average hardness of the irradiation. The measured cable responses in units of Coulomb/rad(Si)-cm were compared to values calculated on the basis of photoemission from metal surfaces and electron ranges in insulators. It was found that the currents induced on the center conductors were several times larger than predicted for an ideal coaxial geometry because of small gaps between the dielectric surface and overlapping braid wires. For a given cable type, such as RG-174/U, large variations in cable responses were found according to each manufacturer´s construction techniques.
Keywords
Coaxial cables; Conductors; Current measurement; Electrons; Filters; Metal-insulator structures; Photoelectricity; Plasma devices; Plasma measurements; Pulse measurements;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1973.4327373
Filename
4327373
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