• DocumentCode
    813192
  • Title

    X-Ray Induced Electron Emission II

  • Author

    Bradford, John N.

  • Author_Institution
    Air Force Cambridge Research Laboratories L G Hanscom Fld Bedford MA 01730
  • Volume
    20
  • Issue
    6
  • fYear
    1973
  • Firstpage
    105
  • Lastpage
    110
  • Abstract
    The x-ray induced photoemission measurements made at AFCRL have been used as a basis for comparison to the computed results of the POEM Monte Carlo electron transport code. The results show spectral shapes which closely resemble the experimental data and absolute yield values which agree within 15-27%. The measurements have been continued and the angular distributions from irradiated Al and Ta plates have been determined. The Ta distribution function for electron emission changes from cos ¿ about the surface normal for normally incident x-rays to isotropic for large angles of incidence. The Al in contrast changes from cos ¿ for normal incidence to a forward lobed shape for large angles of incidence. Both target materials show substantial yield increases at increasing angles of incidence.
  • Keywords
    Distribution functions; Electron emission; Energy measurement; Force measurement; Laboratories; Military computing; Monte Carlo methods; Photoelectricity; Shape measurement; Spectral shape;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1973.4327379
  • Filename
    4327379