DocumentCode
813192
Title
X-Ray Induced Electron Emission II
Author
Bradford, John N.
Author_Institution
Air Force Cambridge Research Laboratories L G Hanscom Fld Bedford MA 01730
Volume
20
Issue
6
fYear
1973
Firstpage
105
Lastpage
110
Abstract
The x-ray induced photoemission measurements made at AFCRL have been used as a basis for comparison to the computed results of the POEM Monte Carlo electron transport code. The results show spectral shapes which closely resemble the experimental data and absolute yield values which agree within 15-27%. The measurements have been continued and the angular distributions from irradiated Al and Ta plates have been determined. The Ta distribution function for electron emission changes from cos ¿ about the surface normal for normally incident x-rays to isotropic for large angles of incidence. The Al in contrast changes from cos ¿ for normal incidence to a forward lobed shape for large angles of incidence. Both target materials show substantial yield increases at increasing angles of incidence.
Keywords
Distribution functions; Electron emission; Energy measurement; Force measurement; Laboratories; Military computing; Monte Carlo methods; Photoelectricity; Shape measurement; Spectral shape;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1973.4327379
Filename
4327379
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