DocumentCode :
813429
Title :
Potential for Thomson scatter with an X-ray laser
Author :
Riley, David ; Keenan, Roisin ; Topping, Simon J. ; Khattak, Fida Y. ; McEvoy, Anne-Marie ; Angulo, Julio J. ; Lamb, Martin J. ; Lewis, Ciaran L S ; Neely, David ; Notley, Margaret
Author_Institution :
Sch. of Math. & Phys., Queen´´s Univ. of Belfast, UK
Volume :
31
Issue :
5
fYear :
2003
Firstpage :
1016
Lastpage :
1022
Abstract :
The authors present an analysis of an X-ray laser Thomson scatter experiment attempted at the Rutherford-Appleton Laboratory. Although the experiment was for technical reasons not completed, an analysis of the feasibility is instructive. X-ray lasers are potentially a useful source for this type of experiment as they have high brightness, short pulse duration, and low divergence. Thomson scatter has proved to be a powerful diagnostic technique in low density plasmas and the extension of this diagnostic technique to shorter wavelengths in the XUV region would allow probing of plasmas at higher densities where classical plasma models such as the Debye-Huckel model breakdown. The authors show in their analysis that, at current output levels, self-emission may hamper attempts to probe high-density plasmas. However, a range of interesting plasmas can be probed which would be too optically thick for optical probing.
Keywords :
X-ray applications; X-ray lasers; X-ray scattering; plasma density; plasma diagnostics; plasma electromagnetic wave propagation; Debye-Huckel model; Thomson scattering; X-ray laser; brightness; divergence; high-density plasmas; low density plasmas; optical probing; optically thick plasmas; plasma diagnostic technique; pulse duration; self-emission; Brightness; Optical pulses; Optical scattering; Plasma density; Plasma diagnostics; Plasma sources; Plasma waves; Plasma x-ray sources; X-ray lasers; X-ray scattering;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2003.818769
Filename :
1240052
Link To Document :
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