• DocumentCode
    813429
  • Title

    Potential for Thomson scatter with an X-ray laser

  • Author

    Riley, David ; Keenan, Roisin ; Topping, Simon J. ; Khattak, Fida Y. ; McEvoy, Anne-Marie ; Angulo, Julio J. ; Lamb, Martin J. ; Lewis, Ciaran L S ; Neely, David ; Notley, Margaret

  • Author_Institution
    Sch. of Math. & Phys., Queen´´s Univ. of Belfast, UK
  • Volume
    31
  • Issue
    5
  • fYear
    2003
  • Firstpage
    1016
  • Lastpage
    1022
  • Abstract
    The authors present an analysis of an X-ray laser Thomson scatter experiment attempted at the Rutherford-Appleton Laboratory. Although the experiment was for technical reasons not completed, an analysis of the feasibility is instructive. X-ray lasers are potentially a useful source for this type of experiment as they have high brightness, short pulse duration, and low divergence. Thomson scatter has proved to be a powerful diagnostic technique in low density plasmas and the extension of this diagnostic technique to shorter wavelengths in the XUV region would allow probing of plasmas at higher densities where classical plasma models such as the Debye-Huckel model breakdown. The authors show in their analysis that, at current output levels, self-emission may hamper attempts to probe high-density plasmas. However, a range of interesting plasmas can be probed which would be too optically thick for optical probing.
  • Keywords
    X-ray applications; X-ray lasers; X-ray scattering; plasma density; plasma diagnostics; plasma electromagnetic wave propagation; Debye-Huckel model; Thomson scattering; X-ray laser; brightness; divergence; high-density plasmas; low density plasmas; optical probing; optically thick plasmas; plasma diagnostic technique; pulse duration; self-emission; Brightness; Optical pulses; Optical scattering; Plasma density; Plasma diagnostics; Plasma sources; Plasma waves; Plasma x-ray sources; X-ray lasers; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2003.818769
  • Filename
    1240052