Title :
On charge injection in analog MOS switches and dummy switch compensation techniques
Author :
Eichenberger, Christoph ; Guggenbuhl, Walter
Author_Institution :
Electron. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland
fDate :
2/1/1990 12:00:00 AM
Abstract :
Theoretical and experimental results of the clock-feedthrough phenomenon (charge injection) in sample-and-hold circuits using minimum feature size transistors of a self-aligned 3-μm CMOS technology are compared. The lumped RC model of the conductive channel has been used and verified in different switch configurations, including variable input voltages. Special emphasis is laid on the feasibility and limits of charge cancellation techniques using dummy switch designs
Keywords :
CMOS integrated circuits; analogue circuits; sample and hold circuits; 3 micron; CMOS technology; analog MOS switches; charge cancellation techniques; charge injection; clock-feedthrough phenomenon; conductive channel; dummy switch compensation techniques; dummy switch designs; lumped RC model; minimum feature size; sample-and-hold circuits; self-aligned technology; switch configurations; variable input voltages; CMOS technology; Clocks; Digital filters; Eigenvalues and eigenfunctions; Hardware; Multidimensional signal processing; State-space methods; Switches; Switching circuits; Voltage;
Journal_Title :
Circuits and Systems, IEEE Transactions on
