On charge injection in analog MOS switches and dummy switch compensation techniques

Author

Eichenberger, Christoph ; Guggenbuhl, Walter

Author_Institution

Electron. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland

Volume

37

Issue

2

fYear

1990

fDate

2/1/1990 12:00:00 AM

Firstpage

256

Lastpage

264

Abstract

Theoretical and experimental results of the clock-feedthrough phenomenon (charge injection) in sample-and-hold circuits using minimum feature size transistors of a self-aligned 3-μm CMOS technology are compared. The lumped RC model of the conductive channel has been used and verified in different switch configurations, including variable input voltages. Special emphasis is laid on the feasibility and limits of charge cancellation techniques using dummy switch designs

Keywords

CMOS integrated circuits; analogue circuits; sample and hold circuits; 3 micron; CMOS technology; analog MOS switches; charge cancellation techniques; charge injection; clock-feedthrough phenomenon; conductive channel; dummy switch compensation techniques; dummy switch designs; lumped RC model; minimum feature size; sample-and-hold circuits; self-aligned technology; switch configurations; variable input voltages; CMOS technology; Clocks; Digital filters; Eigenvalues and eigenfunctions; Hardware; Multidimensional signal processing; State-space methods; Switches; Switching circuits; Voltage;

fLanguage

English

Journal_Title

Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0098-4094

Type

jour

DOI

10.1109/31.45719

Filename

45719