• DocumentCode
    813593
  • Title

    Improved Long Pulse Ionization Simulation Using Pulsed Reactors

  • Author

    Steichen, C.U. ; Retzler, J.P. ; Apodaca, L.

  • Author_Institution
    Autonetics Division of Rockwell International Anaheim, California
  • Volume
    20
  • Issue
    6
  • fYear
    1973
  • Firstpage
    331
  • Lastpage
    340
  • Abstract
    Recently developed methods to improve the usefulness of pulsed nuclear reactors as sources for simulation of wide pulse ionization environments, generated by weapon produced neutrons, are described. These methods include the use of a special shield material which performs the dual role of attenuating neutrons and enhancing gamma dose rate, tailoring of pulse shapes by modifying the reactor burst characteristics through selective coupling between the reactor core and special reflector configurations, and use of special shield configurations to improve dose uniformity. Data obtained at the White Sands Missile Range Fast Burst Reactor and the Sandia Corporation SPR II for several shield configurations and reactor operating conditions are presented. Gamma radiation dose rates and 1 MeV damage equivalent neutron fluences obtained with and without use of the special shield material are compared. Dose rate enhancements of 5.2 and 3.3 times free fields were achieved behind shield thicknesses of 5 and 12 in., respectively. The respective neutron fluences were reduced by factors of 5.5 and 62. A peak dose rate enhancement of 12.4 times free field was achieved between slabs of shield material. Peak dose rates of 5 × 107, 1 × 107, and 1.2 × 106 rads(Si)/sec were achieved behind the shield material for pulse widths of 52 ¿sec, 100 ¿sec, and 1 msec, respectively, while limiting the neutron fluence to approximately 1 × 1011 n/cm2.
  • Keywords
    Gamma rays; Inductors; Ionization; Missiles; Neutrons; Nuclear power generation; Pulse generation; Pulse shaping methods; Shape; Weapons;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1973.4327416
  • Filename
    4327416