DocumentCode :
813802
Title :
Identification of the defective transmission devices using the wavelet transform
Author :
Wang, Bingchen ; Omatu, Sigeru ; Abe, Toshiro
Author_Institution :
Div. of Comput. & Syst. Sci., Osaka Prefecture Univ., Japan
Volume :
27
Issue :
6
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
919
Lastpage :
928
Abstract :
In this paper, a system is described that uses the wavelet transform to automatically identify the particular failure mode of a known defective transmission device. The problem of identifying a particular failure mode within a costly failed assembly is of benefit in practical applications. In this system, external acoustic sensors, instead of intrusive vibrometers, are used to record the acoustic data of the operating transmission device. A skilled factory worker, who is unfamiliar with statistical classification, helps to determine the feature vector of the particular failure mode in the feature extraction process. In the automatic identification part, an improved learning vector quantization (LVQ) method with normalizing the inputting feature vectors is proposed to compensate for variations in practical data. Some acoustic data, which are collected from the manufacturing site, are utilized to test the effectiveness of the described identification system. The experimental results show that this system can identify the particular failure mode of a defective transmission device and find out the causes of failure successfully.
Keywords :
acoustic signal processing; failure analysis; feature extraction; learning (artificial intelligence); power transmission (mechanical); vector quantisation; wavelet transforms; defective transmission device identification; external acoustic sensors; failure mode; feature extraction; learning vector quantization; statistical classification; wavelet transform; Acoustic devices; Acoustic sensors; Acoustic testing; Assembly; Feature extraction; Manufacturing; Production facilities; Vector quantization; Vibrometers; Wavelet transforms; Automatic identification; GA.; LVQ; feature extraction; wavelet transform; Acoustics; Algorithms; Artificial Intelligence; Cluster Analysis; Equipment Failure Analysis; Information Storage and Retrieval; Pattern Recognition, Automated; Signal Processing, Computer-Assisted; Sound Spectrography;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2005.121
Filename :
1432721
Link To Document :
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