• DocumentCode
    813843
  • Title

    Efficient event-driven simulation by exploiting the output observability of gate clusters

  • Author

    Maurer, Peter M.

  • Author_Institution
    Dept. of Comput. Sci., Baylor Univ., Waco, TX, USA
  • Volume
    22
  • Issue
    11
  • fYear
    2003
  • Firstpage
    1471
  • Lastpage
    1486
  • Abstract
    State machine-based simulation is an efficient event-driven simulation technique which has been used to simulate gate-level circuits. Although this approach has been proven to be successful, the techniques that have been used up to now have been limited in several ways. This paper introduces generic state machines that can be used in a wide variety of contexts. These machines are then used to create efficient new simulation techniques that can be applied not just to gates, but to a wide variety of specifications, including Boolean expressions, binary decision diagrams and truth tables. These techniques can combine clusters of gates into a single simulation unit that can be simulated as efficiently as a single gate. The resultant state machines can be simplified by identifying and combining symmetric inputs. Two different types of symmetries can be detected, ordinary symmetry, such as that exhibited by an AND gate, and inverted symmetry, where an input is symmetric with the complement of another input. Both sorts of symmetry can be used for state machine simplification. Experimental results show a substantial reduction in simulation time for complex circuits.
  • Keywords
    Boolean functions; binary decision diagrams; discrete event simulation; logic CAD; logic simulation; observability; Boolean expressions; binary decision diagrams; event-driven simulation; gate clusters; generic state machines; inverted symmetry; output observability; simulation techniques; simulation time; simulation unit; state machine simplification; symmetric inputs; truth tables; Automatic testing; Boolean functions; Circuit simulation; Computational modeling; Computer simulation; Data structures; Design automation; Discrete event simulation; Logic; Observability;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2003.818305
  • Filename
    1240087