Title :
Parsing with probabilistic strictly locally testable tree languages
Author :
Verdú-Mas, Jose Luis ; Carrasco, Rafael C. ; Calera-Rubio, Jorge
Author_Institution :
Departament de Llenguatges i Sistemes Informatics, Universidad de Alicante, Spain
fDate :
7/1/2005 12:00:00 AM
Abstract :
Probabilistic k-testable models (usually known as k-gram models in the case of strings) can be easily identified from samples and allow for smoothing techniques to deal with unseen events during pattern classification. In this paper, we introduce the family of stochastic k-testable tree languages and describe how these models can approximate any stochastic rational tree language. The model is applied to the task of learning a probabilistic k-testable model from a sample of parsed sentences. In particular, a parser for a natural language grammar that incorporates smoothing is shown.
Keywords :
grammars; pattern classification; smoothing methods; trees (mathematics); k-gram models; natural language grammar; parsed sentences; pattern classification; probabilistic k-testable models; probabilistic strictly locally testable tree languages; smoothing techniques; stochastic k-testable tree languages; stochastic rational tree language; Automata; Humans; Natural language processing; Natural languages; Pattern classification; Predictive models; Smoothing methods; Stochastic processes; Testing; Text processing; Index Terms- Parsing with probabilistic grammars; stochastic learning; tree grammars.; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Information Storage and Retrieval; Models, Statistical; Natural Language Processing; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Sequence Alignment; Sequence Analysis; Signal Processing, Computer-Assisted;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.144