• DocumentCode
    814237
  • Title

    Effect of tool eccentricity on some electrical well-logging tools

  • Author

    Lovell, John R. ; Chew, Weng Cho

  • Author_Institution
    Schlumberger-Doll Res., Ridgefield, CT, USA
  • Volume
    28
  • Issue
    1
  • fYear
    1990
  • fDate
    1/1/1990 12:00:00 AM
  • Firstpage
    127
  • Lastpage
    136
  • Abstract
    An algorithm is presented to compute efficiently the propagation of nonaxially symmetric waves induced by realistic eccentered sources with a mandrel in a multicylindrically layered geometry. One of the applications of such a program is in electrical well logging, where all exploration tools operate in a borehole drilled into the ground for geophysical subsurface sensing. The borehole surrounded by an invasion zone can be modeled as a multicylindrically layered geometry. The authors also present an algorithm to study the effect of eccentricity (source and mandrel not in the center of the borehole) in the presence of concentric invasion zones around the borehole. The authors´ algorithm is used to study the eccentricity and invasion effects on an induction measurement and a dielectric logging measurement. In the case of dielectric logging, they find that the invasion zone can cause resonance effects, and that these effects remain when the tool is eccentered
  • Keywords
    geophysical prospecting; geophysical techniques; terrestrial electricity; algorithm; borehole; dielectric logging; electrical well-logging tools; exploration tools; geophysical subsurface sensing; geophysical techniques; induction measurement; invasion zone; mandrel; multicylindrically layered geometry; nonaxially symmetric waves; propagation; prospecting; realistic eccentered sources; resonance; tool eccentricity; Coils; Computational geometry; Conductivity; Dielectric constant; Dielectric measurements; Equations; Geophysical measurements; Geophysics computing; Matrix decomposition; Well logging;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/36.45750
  • Filename
    45750