DocumentCode
814270
Title
Encapsulation of High-Purity Germanium Detectors
Author
Armantrout, G.A. ; Wichner, R. ; Swierkowski, S.P.
Author_Institution
Lawrence Livermore Laboratory, University of California Livermore, California 94550
Volume
21
Issue
1
fYear
1974
Firstpage
344
Lastpage
346
Abstract
The encapsulation of high purity germanium detectors is very desirable in order to increase their versatility and reliability. However, rapid and extensive degradation is seen for all detectors made from detector grade crystals which are encapsulated in a simple vacuum. Extensive studies have shown that the cause of this degradation is hydrogen adsorption on the detector surface. There it causes the formation of a strong p+ inversion layer which in turn shunts the detector junction. Reliable encapsulation is shown to be achievable by the use of hydrogen-free germanium crystals.
Keywords
Aluminum; Crystals; Degradation; Detectors; Encapsulation; Germanium; Hydrogen; Leak detection; Protection; Surface contamination;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1974.4327481
Filename
4327481
Link To Document