DocumentCode :
814335
Title :
Enhancement in light output of InGaN-based microhole array light-emitting diodes
Author :
Hsueh, T.H. ; Sheu, J.K. ; Huang, H.W. ; Chu, J.Y. ; Kao, C.C. ; Kuo, H.C. ; Wang, S.C.
Author_Institution :
Dept. of Photonics, Nat. Chiao Tung Univ., Hinchu, Taiwan
Volume :
17
Issue :
6
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
1163
Lastpage :
1165
Abstract :
InGaN-based microhole array light-emitting diodes (LEDs) with hole diameters (d) of 3-15 μm were fabricated using self-aligned etching. The effects of size on the device characteristics, including current density-voltage and light output-current density, were measured and compared with those of conventional broad-area (BA) LEDs fabricated from the same wafer. The electrical characteristics of the devices are similar to those of conventional BA LEDs. The light output from the microhole array LEDs increases with d up to 7 μm. However, the light output declined as d increased further, perhaps because of the combination of the enhancement in extraction efficiency caused by the large surface areas provided by the sidewalls and the decrease in area of light generation by holes in the microhole array LEDs. The ray tracing method was used with a two-dimensional model in TracePro software. The findings indicate that an optimal design can improve the light output efficiently of the microhole array LEDs.
Keywords :
III-V semiconductors; etching; gallium compounds; indium compounds; light emitting diodes; micro-optics; optical arrays; quantum well devices; ray tracing; semiconductor device models; 3 to 15 mum; InGaN-based LED; LED fabrication; TracePro software; current density-voltage; device characteristics; electrical characteristics; extraction efficiency; light generation; light output enhancement; light output-current density; light-emitting diodes; microhole array LED; quantum-well LED; ray tracing method; self-aligned etching; two-dimensional model; Current measurement; Density measurement; Electric variables; Etching; Fabrication; Gallium nitride; Light emitting diodes; Optical arrays; Ray tracing; Size measurement; GaN; micro-light-emitting diode (; quantum well (QW);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2005.846459
Filename :
1432763
Link To Document :
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