Title :
Charge control of parallel-plate, electrostatic actuators and the tip-in instability
Author :
Seeger, Joseph I. ; Boser, Bernhard E.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, CA, USA
Abstract :
Controlling the charge, rather than the voltage, on a parallel-plate, electrostatic actuator theoretically permits stable operation for all deflections. Practically, we show that, using charge control, the maximum stable deflection is limited by 1) charge pull-in, in which the actuator snaps due to the presence of parasitic capacitance and 2) tip-in, in which the rotation mode becomes unstable. This work presents a circuit that controls the amount of charge on a parallel-plate, electrostatic actuator. This circuit reduces the sensitivity to parasitic capacitance, so that tip-in is the limiting instability. A small-signal model of the actuator is developed and used to determine the circuit bandwidth and gain requirements for stable deflections. Four different parallel-plate actuators have been designed and tested to verify the charge control technique as well as to verify charge pull-in, tip-in, and the bandwidth requirements. One design travels 83% of the gap before tip-in. Another design can only travel 20% of the gap before tip-in, regardless of whether voltage control or charge control is used.
Keywords :
capacitance; electric charge; electric variables control; electrostatic actuators; equivalent circuits; feedback; mechanical stability; rotation; step response; actuation voltage minimization; bandwidth requirements; charge control; charge pull-in; electrostatic actuators; maximum stable deflection; parallel-plate actuators; parasitic capacitance; rotation mode instability; small-signal equivalent circuit; small-signal model; stable operation; tip-in instability; Bandwidth; Circuits; Electric variables control; Electrodes; Electrostatic actuators; Optical feedback; Optical variables control; Parasitic capacitance; Position measurement; Voltage control;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2003.818455