Title :
Indirect testing of digital-correction circuits in analog-to-digital converters with redundancy
Author :
Lewis, Stephen H. ; Ramachandran, R. ; Snelgrove, W. Martin
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
fDate :
7/1/1995 12:00:00 AM
Abstract :
This paper presents a study of indirect fault testing of digital-correction circuits that operate as a part of analog-to-digital converters with redundancy. Design and test techniques that improve the fault coverage are described. The limitations of these techniques and methods to overcome these limitations are presented
Keywords :
analogue-digital conversion; fault diagnosis; integrated circuit testing; redundancy; ADC testing; analog-to-digital converters; digital-correction circuits; fault coverage improvement; indirect fault testing; redundancy; Analog-digital conversion; BiCMOS integrated circuits; CMOS technology; Circuit faults; Circuit testing; Costs; Logic testing; Power dissipation; Redundancy; Signal processing algorithms;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
