Title :
CYCLOGEN: automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation
Author :
Bechir, Ayari ; Kaminska, Bozena
Author_Institution :
Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
fDate :
7/1/1995 12:00:00 AM
Abstract :
In this paper we have laid the foundations for a functional test generation procedure based on a cyclomatic complexity measure (CCM) and on the reduced, ordered binary decision diagram representation (ROBDD) for Boolean function manipulation. The CCM has been defined for single-output and multioutput electronic circuits. This measure computes the number of BDD paths to be transformed into test vectors. This new test generation approach, called CYCLOGEN, has been implemented, and the tests for several functional primitives, as well as the ISCAS-85 benchmark circuits, have been generated successfully. The results show that this approach is effective and promising
Keywords :
Boolean functions; automatic test software; combinational circuits; integrated circuit testing; logic testing; Boolean function manipulation; CYCLOGEN; ROBDD representation; automatic test generator; binary decision diagram; cyclomatic complexity measure; functional test generation; reduced ordered BDD; test vectors; Automatic testing; Benchmark testing; Binary decision diagrams; Boolean functions; Circuit faults; Circuit testing; Data structures; Design automation; Electronic circuits; Logic testing;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
