Self-initializing memory elements

Test generation for sequential circuits is complicated by the fact that the initial internal state of a circuit, after power-up, cannot be predicted. This is commonly referred to as the initializability problem. In this paper, we present a new solution to the initializability problem - self-initializing memory elements (SIME´s). SIME´s are designed to initialize, at power-up, to a known state. The start-up environment of a memory element is analyzed in detail. This analysis is used to design several different types of SIME´s. Each of the designs meet different user requirements. We also discuss the application of SIME´s to the problem of test generation for sequential circuits. SIME´s have distinct advantages over on-chip reset signals. Compared to off-chip reset signals, they offer a different overhead-benefit trade-off. They may also be used in conjunction with other design for test techniques. In short, they provide a designer with additional flexibility during the design process