Title :
Two-type-interlaced structure and LBR test for low-sensitivity digital filter realization
Author :
Lim, II-Taek ; Lee, Byeong Gi
Author_Institution :
LG Electronics Res. Center, Seoul, South Korea
fDate :
7/1/1995 12:00:00 AM
Abstract :
The authors present a new digital filter structure which shows a low-sensitivity property. It is a cascade structure consisting of Type 1 and Type 2 LBR two-pairs interlacing each other, and is called a two-type-interlaced (TTI) structure. In addition, a test procedure called an LBR test is introduced as a means to determine the LBR-ness of the quantized TTI structure by checking the LBR-ness of the residual Type 1 two-pair in the associated Type 3 re-assembled structure. Computer simulation confirms that this new structure exhibits a much improved sensitivity characteristic over the other existing structures
Keywords :
cascade networks; circuit stability; digital filters; filtering theory; sensitivity analysis; LBR test; cascade structure; digital filter structure; lossless bounded real test; low-sensitivity digital filter; low-sensitivity property; test procedure; two-type-interlaced structure; Analog circuits; Chebyshev approximation; Circuit noise; Circuit testing; Computer simulation; Degradation; Digital filters; Filtering; Lattices; Passband;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
