DocumentCode :
814596
Title :
Self-checking logic design for FPGA implementation
Author :
Lala, Parag K. ; Burress, Alfred L.
Author_Institution :
Dept. of Comput. Sci. & Comput. Eng., Univ. of Arkansas, Fayetteville, AR, USA
Volume :
52
Issue :
5
fYear :
2003
Firstpage :
1391
Lastpage :
1398
Abstract :
Field programmable gate arrays (FPGAs) are being increasingly used in many systems including intelligent instrumentation. A synthesis algorithm for generating self-checking combinational logic for implementation on look-up table based FPGAs is presented. The algorithm maps Boolean functions into FPGAs such that self-checking features are automatically incorporated into designs, allowing on-line detection of faults in the combinational function block within any configurable logic block of an FPGA and on the interconnect lines that connect these blocks. This is accomplished by utilizing two types of cells, a functional cell and a checker cell, that generate complementary outputs during normal operation, and outputs of the same value in the presence of a fault. If a fault occurs in any intermediate functional cell, it is automatically propagated to the primary outputs. A checker cell is then used to verify the correctness of the final outputs, thus allowing self-checking.
Keywords :
Boolean functions; built-in self test; combinational circuits; field programmable gate arrays; logic design; logic testing; table lookup; Boolean functions; CLB; FPGA implementation; LUT; checker cell; combinational function block; configurable logic blocks; field programmable gate arrays; functional cell; intelligent instrumentation; interconnect lines; look-up table based FPGA; on-line fault detection; self-checking combinational logic; self-checking logic design; two-rail checker; Algorithm design and analysis; Automatic logic units; Boolean functions; Fault detection; Field programmable gate arrays; Instruments; Intelligent systems; Logic design; Programmable logic arrays; Table lookup;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.818545
Filename :
1240152
Link To Document :
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